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Engineering Mathematics
Review of Viscous Flows
Review of Computational Fluid Mechanics
Review of Turbulence and Turbulence Modeling

Particle Adhesion
Colloids
Simulation Methods
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ME 637 The National Science Foundation
 Particle Adhesion
Van der Waals Force | JKR and Other Adhesion Models | Particle Adhesion & Removal | Effects of Charge | Effect of Humidity | Ultrasonic and Megasonic Cleaning

Effects of Charge

Forces Acting on Particle

For a single, dielectric, spherical particle with a uniform charge distribution

FIm = 12 nN

Van der Waals attraction:

FVW = 625 nN

Define Rcrit by FVW = FIm

If:A = 10-19 Jz0 = 4 Å

Þ Rcrit = 0.5 mm

For R < Rcrit:van der Waals dominated

For R > Rcrit:electrostatic dominated

However:Both forces contribute to adhesion.



Dr. Goodarz Ahmadi | Turbulence & Multiphase Fluid Flow Laboratory | Department of Mechanical & Aeronautical Engineering
Copyright © 2002-2005 Dr. Goodarz Ahmadi. All rights reserved.
Potsdam, New York, 13699
ahmadi@clarkson.edu