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Engineering Mathematics
Review of Viscous Flows
Review of Computational Fluid Mechanics

Particle Adhesion
Simulation Methods
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The National Science Foundation
ME 537 The National Science Foundation
 Particle Adhesion
Van der Waals Force | JKR and Other Adhesion Models | Particle Adhesion & Removal | Effects of Charge | Effect of Humidity | Ultrasonic and Megasonic Cleaning

Effects of Charge

Photoconductor

Schematic illustration of experimental setup.The larger toner particles fix the size of the air gap

while the applied electric field cause the smaller particle to transfer from the photoconductor (top) to the receiver (bottom).

Thus far, it would appear that the JKR contact mechanics assumption is valid.

However, if electrostatic forces become more significant, long-range interactions would have to be taken into account.



Dr. Goodarz Ahmadi | Turbulence & Multiphase Fluid Flow Laboratory | Department of Mechanical & Aeronautical Engineering
Copyright © 2002-2005 Dr. Goodarz Ahmadi. All rights reserved.
Potsdam, New York, 13699
ahmadi@clarkson.edu